Presentation at SPIE MI 2018

Presentation at SPIE MI 2018

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We will present 2 papers during SPIE Medical Imaging 2018, February 10–15, Houston, TX.

  1. PcTK and CT workflow will be presented as an oral presentation 10573-35, 3:50–4:10 pm, Feb 13 (Tue), Salon C in Session 7 (Photon Counting Detectors).
  2. The effect of correlated noise and spectral distortion with NxN pixel binning and anti-scatter collimators (or sub-pixel masking) will be analyzed using PcTK. It will be presented as a poster 10573-183, 5:30–7:00 pm, Feb 14 (Wed), Salon E in Session PS10 (Posters: Photon-Counting Imaging).

We look forward to seeing you there.

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